From: Octavian Purdila <octavian.purdila@intel.com>
To: jic23@kernel.org
Cc: knaack.h@gmx.de, lars@metafoo.de, pmeerw@pmeerw.net,
linux-iio@vger.kernel.org, linux-kernel@vger.kernel.org,
adriana.reus@intel.com, linux-api@vger.kernel.org,
Octavian Purdila <octavian.purdila@intel.com>
Subject: [RFC PATCH 2/3] iio: allow better control for flushing the hardware fifo
Date: Wed, 29 Apr 2015 14:18:59 +0300 [thread overview]
Message-ID: <1430306340-5026-3-git-send-email-octavian.purdila@intel.com> (raw)
In-Reply-To: <1430306340-5026-1-git-send-email-octavian.purdila@intel.com>
Some applications need to be able to flush [1] the hardware fifo of
the device and to receive events of when that happened [2] so that it
can ignore stale data.
This patch adds a new event (IIO_EV_TYPE_HWFIFO_FLUSHED) that should
be sent to userspace when a flush has been completed. The application
will be able to identify which are the samples to ignore based on the
timestamp of the event.
To allow applications to accurately generate a hardware fifo flush on
demand, this patch also adds a new sysfs entry that triggers a
hardware fifo flush when written to.
[1] https://source.android.com/devices/sensors/hal-interface.html#flush_sensor
[2] https://source.android.com/devices/sensors/hal-interface.html#metadata_flush_complete_events
Signed-off-by: Octavian Purdila <octavian.purdila@intel.com>
---
Documentation/ABI/testing/sysfs-bus-iio | 11 +++++++++++
include/linux/iio/sysfs.h | 3 +++
include/uapi/linux/iio/types.h | 1 +
3 files changed, 15 insertions(+)
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index 866b4ec..bb4d8de 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -1375,3 +1375,14 @@ Description:
The emissivity ratio of the surface in the field of view of the
contactless temperature sensor. Emissivity varies from 0 to 1,
with 1 being the emissivity of a black body.
+
+What: /sys/bus/iio/devices/iio:deviceX/buffer/hwfifo_flush
+KernelVersion: 4.2
+Contact: linux-iio@vger.kernel.org
+Description:
+ Write only entry that accepts a single strictly positive integer
+ specifying the number of samples to flush from the hardware fifo
+ to the device buffer. When the flush is completed an
+ IIO_EV_TYPE_HWFIFO_FLUSHED event is generated. The event has the
+ timestamp equal with the timestamp of last sample that was
+ flushed from the hardware fifo.
diff --git a/include/linux/iio/sysfs.h b/include/linux/iio/sysfs.h
index 8822bab..8fcc25b 100644
--- a/include/linux/iio/sysfs.h
+++ b/include/linux/iio/sysfs.h
@@ -136,4 +136,7 @@ struct iio_const_attr {
#define IIO_DEV_ATTR_HWFIFO_WATERMARK(_hwfifo_get_wm) \
IIO_DEVICE_ATTR(hwfifo_watermark, S_IRUGO, _hwfifo_get_wm, NULL, 0)
+#define IIO_DEV_ATTR_HWFIFO_FLUSH(_hwfifo_flush) \
+ IIO_DEVICE_ATTR(hwfifo_flush, S_IWUSR, NULL, _hwfifo_flush, 0)
+
#endif /* _INDUSTRIAL_IO_SYSFS_H_ */
diff --git a/include/uapi/linux/iio/types.h b/include/uapi/linux/iio/types.h
index 5c46019..4600157 100644
--- a/include/uapi/linux/iio/types.h
+++ b/include/uapi/linux/iio/types.h
@@ -79,6 +79,7 @@ enum iio_event_type {
IIO_EV_TYPE_THRESH_ADAPTIVE,
IIO_EV_TYPE_MAG_ADAPTIVE,
IIO_EV_TYPE_CHANGE,
+ IIO_EV_TYPE_HWFIFO_FLUSHED,
};
enum iio_event_direction {
--
1.9.1
next prev parent reply other threads:[~2015-04-29 11:19 UTC|newest]
Thread overview: 8+ messages / expand[flat|nested] mbox.gz Atom feed top
2015-04-29 11:18 [RFC PATCH 0/3] " Octavian Purdila
2015-04-29 11:18 ` [RFC PATCH 1/3] iio: add hwfifo attributes helpers Octavian Purdila
2015-04-29 11:18 ` Octavian Purdila [this message]
2015-05-02 17:42 ` [RFC PATCH 2/3] iio: allow better control for flushing the hardware fifo Lars-Peter Clausen
2015-05-03 6:11 ` Octavian Purdila
2015-05-04 14:38 ` Lars-Peter Clausen
2015-05-04 15:36 ` Octavian Purdila
2015-04-29 11:19 ` [RFC PATCH 3/3] iio: accel: bmc150: add support for hwfifo_flush and flush events Octavian Purdila
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