Re: [PATCH v2 1/2] dt-bindings: soc: ti: bist: Add BIST for K3 devices

[Neha Malcom Francis <n-francis@ti.com>]

On 28/03/25 17:18, Krzysztof Kozlowski wrote:
> On 28/03/2025 12:14, Neha Malcom Francis wrote:
>> +properties:
>> +  compatible:
>> +    const: ti,j784s4-bist
>> +
>> +  reg:
>> +    maxItems: 2
>> +
>> +  reg-names:
>> +    items:
>> +      - const: cfg
>> +      - const: ctrl_mmr
>> +
>> +  clocks:
>> +    maxItems: 1
>> +
>> +  power-domains:
>> +    maxItems: 1
>> +
>> +  ti,bist-under-test:
>> +    $ref: /schemas/types.yaml#/definitions/uint32-array
>> +    description:
>> +      the device IDs of the devices under test control of the BIST device, the
> 
> Still not phandle... What is a "device ID"?

I took a shot at working with the phandle, however the test devices may
or may not be present in the devicetree at bootloader stage which is the
only place this BIST driver can execute (I know I shouldn't be bringing
up the driver here but it's crucial to how I can model this property).
HW mandates you run it as early as possible before any other software
executes on the test device.

So now thinking of other possible ways to define the test devices, we
have unique HW identifiers [1] for each of the device which is what I've
used here...

[1]
https://github.com/torvalds/linux/blob/master/Documentation/devicetree/bindings/arm/keystone/ti%2Ck3-sci-common.yaml#L31

> 
>> +      number of devices may be more than one. The HW logic will trigger the
>> +      tests on all of these devices at once.
>> +
>> +required:
>> +  - compatible
>> +  - reg
>> +  - reg-names
>> +  - ti,bist-under-test
>> +
>> +additionalProperties: false
> 
> 
> Best regards,
> Krzysztof

-- 
Thanking You
Neha Malcom Francis