Re: [PATCH] thermal: sun8i: Be loud when probe fails

[Robin Murphy <robin.murphy@arm.com>]

On 2020-07-08 14:21, Ondřej Jirman wrote:
[...]
>>> @@ -523,10 +547,17 @@ static int sun8i_ths_probe(struct platform_device *pdev)
>>>          ret = devm_request_threaded_irq(dev, irq, NULL,
>>>                                          sun8i_irq_thread,
>>>                                          IRQF_ONESHOT, "ths", tmdev);
>>> -       if (ret)
>>> -               return ret;
>>> +       if (ret) {
>>> +               dev_err(dev, "Failed to request irq (%d)\n", ret);
>>> +               goto err_out;
>>> +       }
>>>
>>> +       dev_info(dev, "Thermal sensor ready!\n");
>>>          return 0;
>>> +
>>> +err_out:
>>> +       dev_err(dev, "Failed to probe thermal sensor (%d)\n", ret);
>>
>> When the driver fails, there will be this print. Isn't it superfluous
>> for you to add these？
>>
>> sun8i-thermal: probe of 5070400.thermal-sensor failed with error
> 
> There's no such failure message in the case I investigated, which is
> EPROBE_DEFER failure waiting for nvmem driver that never loads,
> because it's not configured by the user to build.

Ah, in that case this was a bit misleading, since "probe failure" isn't 
really the problem at all. As it happens, there's a whole other 
discussion ongoing around making probe deferral issues easier to debug:

https://lore.kernel.org/linux-arm-kernel/20200626100103.18879-1-a.hajda@samsung.com/

Robin.