Hello Jonathan, On Sun, Sep 07, 2025 at 02:15:15PM +0100, Jonathan Cameron wrote: > On Mon, 1 Sep 2025 22:47:35 +0300 > Petre Rodan wrote: > > > Add event attributes not directly covered by the IIO API. > > These must be accompanied by ABI documentation in > Documentation/ABI/testing/sysfs-bus-iio-... > > We need to pull out of the datasheet generic descriptions of what > they are so we can consider if they make sense as general new ABI > or perhaps map to something existing. In some cases it is more > appropriate just to set a reasonable default and not provide a > userspace ABI at all. > > Key point is that custom ABI is effectively unused ABI because most > software is written against a bunch of devices and has no idea what > the new ABI is. I see your point. From all ot those maybe just the interrupt latch functionality is generic enough, I have seen something similar while writing other drivers. from the datasheet: " The interrupt controller can be used in two modes - Latched mode: Once one of the configured interrupt conditions applies, the INT pin is asserted and must be reset by the external master through the digital interface. - Non-Latched mode: The interrupt controller clears the INT signal once the interrupt condition no longer applies (default behaviour in our chip). The interrupt output can be programmed by lat_int[2:0] to be either unlatched ('000') or latched permanently ('111') or have the latch time of 0.25s ('001')/0.5s('010')/1s('011')/2s('100')/4s('101')/8s('110'). The setting of these bits applies to all types of interrupts." Many thanks for the detailed review, I will prepare a new set in b4 and skip everything event related for now to keep the set smaller. cheers, peter -- petre rodan