* [PATCH v4] media: v4l2-ctrls: add control for test pattern
@ 2012-09-25 6:09 Prabhakar
2012-09-25 6:53 ` Hans Verkuil
2012-10-01 9:16 ` Sakari Ailus
0 siblings, 2 replies; 3+ messages in thread
From: Prabhakar @ 2012-09-25 6:09 UTC (permalink / raw)
To: LMML
Cc: DLOS, LDOC, Mauro Carvalho Chehab, VGER, Sakari Ailus,
Manjunath Hadli, Prabhakar Lad, Hans Verkuil, Laurent Pinchart,
Sylwester Nawrocki, Hans de Goede, Kyungmin Park, Rob Landley
From: Lad, Prabhakar <prabhakar.lad@ti.com>
add V4L2_CID_TEST_PATTERN of type menu, which determines
the internal test pattern selected by the device.
Signed-off-by: Lad, Prabhakar <prabhakar.lad@ti.com>
Signed-off-by: Manjunath Hadli <manjunath.hadli@ti.com>
Acked-by: Sakari Ailus <sakari.ailus@iki.fi>
Cc: Hans Verkuil <hans.verkuil@cisco.com>
Cc: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
Cc: Mauro Carvalho Chehab <mchehab@infradead.org>
Cc: Sylwester Nawrocki <s.nawrocki@samsung.com>
Cc: Hans de Goede <hdegoede@redhat.com>
Cc: Kyungmin Park <kyungmin.park@samsung.com>
Cc: Rob Landley <rob@landley.net>
---
This patches has one checkpatch warning for line over
80 characters altough it can be avoided I have kept it
for consistency.
Changes for v4:
1: Fixed some grammar/style issues, pointed by Hans.
Changes for v3:
1: Removed the menu for test pattern, pointed by Sakari.
Changes for v2:
1: Included display devices in the description for test pattern
as pointed by Hans.
2: In the menu replaced 'Test Pattern Disabled' by 'Disabled' as
pointed by Sylwester.
3: Removed the test patterns from menu as the are hardware specific
as pointed by Sakari.
Documentation/DocBook/media/v4l/controls.xml | 10 ++++++++++
drivers/media/v4l2-core/v4l2-ctrls.c | 2 ++
include/linux/videodev2.h | 1 +
3 files changed, 13 insertions(+), 0 deletions(-)
diff --git a/Documentation/DocBook/media/v4l/controls.xml b/Documentation/DocBook/media/v4l/controls.xml
index f0fb08d..5450d31 100644
--- a/Documentation/DocBook/media/v4l/controls.xml
+++ b/Documentation/DocBook/media/v4l/controls.xml
@@ -4313,6 +4313,16 @@ interface and may change in the future.</para>
</tbody>
</entrytbl>
</row>
+ <row>
+ <entry spanname="id"><constant>V4L2_CID_TEST_PATTERN</constant></entry>
+ <entry>menu</entry>
+ </row>
+ <row id="v4l2-test-pattern">
+ <entry spanname="descr"> Some capture/display/sensor devices have
+ the capability to generate test pattern images. These hardware
+ specific test patterns can be used to test if a device is working
+ properly.</entry>
+ </row>
<row><entry></entry></row>
</tbody>
</tgroup>
diff --git a/drivers/media/v4l2-core/v4l2-ctrls.c b/drivers/media/v4l2-core/v4l2-ctrls.c
index 8f2f40b..41b7732 100644
--- a/drivers/media/v4l2-core/v4l2-ctrls.c
+++ b/drivers/media/v4l2-core/v4l2-ctrls.c
@@ -740,6 +740,7 @@ const char *v4l2_ctrl_get_name(u32 id)
case V4L2_CID_LINK_FREQ: return "Link Frequency";
case V4L2_CID_PIXEL_RATE: return "Pixel Rate";
case V4L2_CID_DPCM_PREDICTOR: return "DPCM Predictor";
+ case V4L2_CID_TEST_PATTERN: return "Test Pattern";
default:
return NULL;
@@ -841,6 +842,7 @@ void v4l2_ctrl_fill(u32 id, const char **name, enum v4l2_ctrl_type *type,
case V4L2_CID_EXPOSURE_METERING:
case V4L2_CID_SCENE_MODE:
case V4L2_CID_DPCM_PREDICTOR:
+ case V4L2_CID_TEST_PATTERN:
*type = V4L2_CTRL_TYPE_MENU;
break;
case V4L2_CID_LINK_FREQ:
diff --git a/include/linux/videodev2.h b/include/linux/videodev2.h
index ca9fb78..7014c0b 100644
--- a/include/linux/videodev2.h
+++ b/include/linux/videodev2.h
@@ -2005,6 +2005,7 @@ enum v4l2_dpcm_predictor {
V4L2_DPCM_PREDICTOR_SIMPLE = 0,
V4L2_DPCM_PREDICTOR_ADVANCED = 1,
};
+#define V4L2_CID_TEST_PATTERN (V4L2_CID_IMAGE_PROC_CLASS_BASE + 4)
/*
* T U N I N G
--
1.7.4.1
^ permalink raw reply [flat|nested] 3+ messages in thread* Re: [PATCH v4] media: v4l2-ctrls: add control for test pattern
2012-09-25 6:09 [PATCH v4] media: v4l2-ctrls: add control for test pattern Prabhakar
@ 2012-09-25 6:53 ` Hans Verkuil
2012-10-01 9:16 ` Sakari Ailus
1 sibling, 0 replies; 3+ messages in thread
From: Hans Verkuil @ 2012-09-25 6:53 UTC (permalink / raw)
To: davinci-linux-open-source
Cc: Prabhakar, LMML, Rob Landley, LDOC, VGER, Mauro Carvalho Chehab,
Hans de Goede, Kyungmin Park, Sakari Ailus, Sylwester Nawrocki,
Hans Verkuil
On Tue September 25 2012 08:09:05 Prabhakar wrote:
> From: Lad, Prabhakar <prabhakar.lad@ti.com>
>
> add V4L2_CID_TEST_PATTERN of type menu, which determines
> the internal test pattern selected by the device.
Acked-by: Hans Verkuil <hans.verkuil@cisco.com>
Regards,
Hans
>
> Signed-off-by: Lad, Prabhakar <prabhakar.lad@ti.com>
> Signed-off-by: Manjunath Hadli <manjunath.hadli@ti.com>
> Acked-by: Sakari Ailus <sakari.ailus@iki.fi>
> Cc: Hans Verkuil <hans.verkuil@cisco.com>
> Cc: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
> Cc: Mauro Carvalho Chehab <mchehab@infradead.org>
> Cc: Sylwester Nawrocki <s.nawrocki@samsung.com>
> Cc: Hans de Goede <hdegoede@redhat.com>
> Cc: Kyungmin Park <kyungmin.park@samsung.com>
> Cc: Rob Landley <rob@landley.net>
> ---
> This patches has one checkpatch warning for line over
> 80 characters altough it can be avoided I have kept it
> for consistency.
>
> Changes for v4:
> 1: Fixed some grammar/style issues, pointed by Hans.
>
> Changes for v3:
> 1: Removed the menu for test pattern, pointed by Sakari.
>
> Changes for v2:
> 1: Included display devices in the description for test pattern
> as pointed by Hans.
> 2: In the menu replaced 'Test Pattern Disabled' by 'Disabled' as
> pointed by Sylwester.
> 3: Removed the test patterns from menu as the are hardware specific
> as pointed by Sakari.
>
> Documentation/DocBook/media/v4l/controls.xml | 10 ++++++++++
> drivers/media/v4l2-core/v4l2-ctrls.c | 2 ++
> include/linux/videodev2.h | 1 +
> 3 files changed, 13 insertions(+), 0 deletions(-)
>
> diff --git a/Documentation/DocBook/media/v4l/controls.xml b/Documentation/DocBook/media/v4l/controls.xml
> index f0fb08d..5450d31 100644
> --- a/Documentation/DocBook/media/v4l/controls.xml
> +++ b/Documentation/DocBook/media/v4l/controls.xml
> @@ -4313,6 +4313,16 @@ interface and may change in the future.</para>
> </tbody>
> </entrytbl>
> </row>
> + <row>
> + <entry spanname="id"><constant>V4L2_CID_TEST_PATTERN</constant></entry>
> + <entry>menu</entry>
> + </row>
> + <row id="v4l2-test-pattern">
> + <entry spanname="descr"> Some capture/display/sensor devices have
> + the capability to generate test pattern images. These hardware
> + specific test patterns can be used to test if a device is working
> + properly.</entry>
> + </row>
> <row><entry></entry></row>
> </tbody>
> </tgroup>
> diff --git a/drivers/media/v4l2-core/v4l2-ctrls.c b/drivers/media/v4l2-core/v4l2-ctrls.c
> index 8f2f40b..41b7732 100644
> --- a/drivers/media/v4l2-core/v4l2-ctrls.c
> +++ b/drivers/media/v4l2-core/v4l2-ctrls.c
> @@ -740,6 +740,7 @@ const char *v4l2_ctrl_get_name(u32 id)
> case V4L2_CID_LINK_FREQ: return "Link Frequency";
> case V4L2_CID_PIXEL_RATE: return "Pixel Rate";
> case V4L2_CID_DPCM_PREDICTOR: return "DPCM Predictor";
> + case V4L2_CID_TEST_PATTERN: return "Test Pattern";
>
> default:
> return NULL;
> @@ -841,6 +842,7 @@ void v4l2_ctrl_fill(u32 id, const char **name, enum v4l2_ctrl_type *type,
> case V4L2_CID_EXPOSURE_METERING:
> case V4L2_CID_SCENE_MODE:
> case V4L2_CID_DPCM_PREDICTOR:
> + case V4L2_CID_TEST_PATTERN:
> *type = V4L2_CTRL_TYPE_MENU;
> break;
> case V4L2_CID_LINK_FREQ:
> diff --git a/include/linux/videodev2.h b/include/linux/videodev2.h
> index ca9fb78..7014c0b 100644
> --- a/include/linux/videodev2.h
> +++ b/include/linux/videodev2.h
> @@ -2005,6 +2005,7 @@ enum v4l2_dpcm_predictor {
> V4L2_DPCM_PREDICTOR_SIMPLE = 0,
> V4L2_DPCM_PREDICTOR_ADVANCED = 1,
> };
> +#define V4L2_CID_TEST_PATTERN (V4L2_CID_IMAGE_PROC_CLASS_BASE + 4)
>
> /*
> * T U N I N G
>
^ permalink raw reply [flat|nested] 3+ messages in thread* Re: [PATCH v4] media: v4l2-ctrls: add control for test pattern
2012-09-25 6:09 [PATCH v4] media: v4l2-ctrls: add control for test pattern Prabhakar
2012-09-25 6:53 ` Hans Verkuil
@ 2012-10-01 9:16 ` Sakari Ailus
1 sibling, 0 replies; 3+ messages in thread
From: Sakari Ailus @ 2012-10-01 9:16 UTC (permalink / raw)
To: Prabhakar
Cc: LMML, DLOS, LDOC, Mauro Carvalho Chehab, VGER, Manjunath Hadli,
Prabhakar Lad, Hans Verkuil, Laurent Pinchart,
Sylwester Nawrocki, Hans de Goede, Kyungmin Park, Rob Landley
Hi Prabhakar,
Prabhakar wrote:
> From: Lad, Prabhakar <prabhakar.lad@ti.com>
>
> add V4L2_CID_TEST_PATTERN of type menu, which determines
> the internal test pattern selected by the device.
>
> Signed-off-by: Lad, Prabhakar <prabhakar.lad@ti.com>
> Signed-off-by: Manjunath Hadli <manjunath.hadli@ti.com>
> Acked-by: Sakari Ailus <sakari.ailus@iki.fi>
> Cc: Hans Verkuil <hans.verkuil@cisco.com>
> Cc: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
> Cc: Mauro Carvalho Chehab <mchehab@infradead.org>
> Cc: Sylwester Nawrocki <s.nawrocki@samsung.com>
> Cc: Hans de Goede <hdegoede@redhat.com>
> Cc: Kyungmin Park <kyungmin.park@samsung.com>
> Cc: Rob Landley <rob@landley.net>
> ---
> This patches has one checkpatch warning for line over
> 80 characters altough it can be avoided I have kept it
> for consistency.
>
> Changes for v4:
> 1: Fixed some grammar/style issues, pointed by Hans.
>
> Changes for v3:
> 1: Removed the menu for test pattern, pointed by Sakari.
>
> Changes for v2:
> 1: Included display devices in the description for test pattern
> as pointed by Hans.
> 2: In the menu replaced 'Test Pattern Disabled' by 'Disabled' as
> pointed by Sylwester.
> 3: Removed the test patterns from menu as the are hardware specific
> as pointed by Sakari.
>
> Documentation/DocBook/media/v4l/controls.xml | 10 ++++++++++
> drivers/media/v4l2-core/v4l2-ctrls.c | 2 ++
> include/linux/videodev2.h | 1 +
> 3 files changed, 13 insertions(+), 0 deletions(-)
>
> diff --git a/Documentation/DocBook/media/v4l/controls.xml b/Documentation/DocBook/media/v4l/controls.xml
> index f0fb08d..5450d31 100644
> --- a/Documentation/DocBook/media/v4l/controls.xml
> +++ b/Documentation/DocBook/media/v4l/controls.xml
> @@ -4313,6 +4313,16 @@ interface and may change in the future.</para>
> </tbody>
> </entrytbl>
> </row>
> + <row>
> + <entry spanname="id"><constant>V4L2_CID_TEST_PATTERN</constant></entry>
> + <entry>menu</entry>
> + </row>
> + <row id="v4l2-test-pattern">
> + <entry spanname="descr"> Some capture/display/sensor devices have
> + the capability to generate test pattern images. These hardware
> + specific test patterns can be used to test if a device is working
> + properly.</entry>
> + </row>
> <row><entry></entry></row>
> </tbody>
> </tgroup>
> diff --git a/drivers/media/v4l2-core/v4l2-ctrls.c b/drivers/media/v4l2-core/v4l2-ctrls.c
> index 8f2f40b..41b7732 100644
> --- a/drivers/media/v4l2-core/v4l2-ctrls.c
> +++ b/drivers/media/v4l2-core/v4l2-ctrls.c
> @@ -740,6 +740,7 @@ const char *v4l2_ctrl_get_name(u32 id)
> case V4L2_CID_LINK_FREQ: return "Link Frequency";
> case V4L2_CID_PIXEL_RATE: return "Pixel Rate";
> case V4L2_CID_DPCM_PREDICTOR: return "DPCM Predictor";
> + case V4L2_CID_TEST_PATTERN: return "Test Pattern";
>
> default:
> return NULL;
> @@ -841,6 +842,7 @@ void v4l2_ctrl_fill(u32 id, const char **name, enum v4l2_ctrl_type *type,
> case V4L2_CID_EXPOSURE_METERING:
> case V4L2_CID_SCENE_MODE:
> case V4L2_CID_DPCM_PREDICTOR:
> + case V4L2_CID_TEST_PATTERN:
> *type = V4L2_CTRL_TYPE_MENU;
> break;
> case V4L2_CID_LINK_FREQ:
> diff --git a/include/linux/videodev2.h b/include/linux/videodev2.h
> index ca9fb78..7014c0b 100644
> --- a/include/linux/videodev2.h
> +++ b/include/linux/videodev2.h
> @@ -2005,6 +2005,7 @@ enum v4l2_dpcm_predictor {
> V4L2_DPCM_PREDICTOR_SIMPLE = 0,
> V4L2_DPCM_PREDICTOR_ADVANCED = 1,
> };
> +#define V4L2_CID_TEST_PATTERN (V4L2_CID_IMAGE_PROC_CLASS_BASE + 4)
>
> /*
> * T U N I N G
>
Acked-by: Sakari Ailus <sakari.ailus@iki.fi>
I'd suggest to rebase this under the DPCM predictor patch. As the choice of
the predictor affects the resulting format, it has to be the same on the
transmitter and the receiver, and also affects the in-memory pixel format.
I'll prepare an RFC on the topic shortly.
Kind regards,
--
Sakari Ailus
sakari.ailus@iki.fi
^ permalink raw reply [flat|nested] 3+ messages in thread
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2012-09-25 6:09 [PATCH v4] media: v4l2-ctrls: add control for test pattern Prabhakar
2012-09-25 6:53 ` Hans Verkuil
2012-10-01 9:16 ` Sakari Ailus
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