Re: [PATCH v10 3/5] hisi_acc_vfio_pci: register debugfs for hisilicon migration driver

[liulongfang <liulongfang@huawei.com>]

On 2023/5/16 17:40, liulongfang wrote:
> On 2023/4/21 22:31, Jason Gunthorpe wrote:
>> On Fri, Apr 21, 2023 at 11:32:47AM +0800, liulongfang wrote:
>>
>>> Thank you for your suggestion, but the current debugfs method can already
>>> meet the functional requirements of verification testing and
>>> problem location.
>>
>> To be clear, I'm against adding selftest code in this manner. We have
>> many frameworks for kernel teesting, please pick one and integrate
>> with it.
>>
> 
> Hi, Jason:
> The purpose of this hisi_acc_vf_debug_restore function is to obtain the
> migration status data of the migration device. It is a debug operation.
> Just to obtain this status data, user need to complete the few steps> of live migration.
> Therefore, it is a debug function here, not a self-test function.
>
Here it should be:
In order to test whether the current state of the device is normal,
perform a recovery test through the data saved during the previous live migration.
It is matched with the previous save.
If you still insist that it is a self-test.
How about I delete this recovery debugfs?

Thanks,
Longfang.
> Thanks,
> Longfang.
>> Jason
>> .
>>